Introduction
We observed wireless network traffic at the 65th IETF Meeting in Dallas, Texas in March of 2006, attended by
approximately 1200 engineers. The event was supported by a very large number of 802.11a and 802.11b access points, often seeing
hundreds of simultaneous users. We were particularly interested in the stability of wireless connectivity, load balancing and loss
behavior, rather than just traffic.We observed distinct differences among client implementations and saw a number of factors that
made the overall system less than optimal, pointing to the need for better design tools and automated adaptation mechanisms.
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Related papers
- A. P. Jardosh, K. N. Ramachandran, K. C. Almeroth, and E. M. Belding-Royer, Understanding
link-layer behavior in highly congested IEEE 802.11b wireless networks, in E-WIND ’05: Proceeding of the 2005 ACM SIGCOMM workshop on experimental
approaches to wireless network design and analysis. New York, NY, USA: ACM Press, 2005, pp. 11–16.
- M. Rodrig, C. Reis, R. Mahajan, D. Wetherall, and J. Zahorjan, Measurement-based
characterization of 802.11 in a hotspot setting, in E-WIND ’05: Proceeding of the 2005 ACM SIGCOMM workshop on Experimental approaches to wireless
network design and analysis. New York, NY, USA: ACM Press, 2005, pp. 5–10.
- A. Balachandran, G. M. Voelker, P. Bahl, and P. V. Rangan, Characterizing user behavior
and network performance in a public wireless LAN, in SIGMETRICS ’02: Proceedings of the 2002 ACM SIGMETRICS international conference on Measurement
and modeling of computer systems. New York, NY, USA: ACM Press, 2002, pp. 195–205.
- D. Kotz and K. Essien, Analysis of a campus-wide wireless network, in MobiCom ’02:
Proceedings of the 8th annual international conference on Mobile computing and networking. New York, NY, USA: ACM Press, 2002, pp. 107–118.
- T. Henderson, D. Kotz, and I. Abyzov, The changing usage of a mature
campus-wide wireless network, in MobiCom ’04: Proceedings of the 10th annual international conference on Mobile computing and networking. New
York, NY, USA: ACM Press, 2004, pp. 187–201.
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